Accelerometers - KISTLER - #4

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Text version of the page
Kistler measures acceleration
Known as Experimental Modal Analysis (EMA), this field of study often uses a mem­ber of the PiezoBeam® family or ceramic shear family where their general character­istics have been adapted to accommodate most requirements of common tests. Typi­cal features include high output from a low weight sensor, ground isolation, and an inexpensive package providing an economi­cal solution for large channel count applica­tions.
Accelerometers are used in every avenue of the dynamic test environment, and Kistler has developed families of products covering this expansive range of applications. From ultra low motion encountered in wafer fabrica­tion technology to shock spectra reconstruc­tion experienced in pyrotechnic separation event studies, and everywhere in between, an optimal sensor solution is available. Static events are captured with the K-Beam® static and low frequency product offerings. Very high frequency activity is routinely measured using any of several miniature piezoelectric single axis or triaxial types. Many sensing technologies including piezoceramic, natural quartz and variable capacitance approaches have been extensively explored and are em­ployed as needed to accommodate the de­mands of the applications.
Some applications include:
Aerospace and military
Very demanding applications are encoun­tered in the military and aerospace industry where any error may present a life-threaten­ing situation. This category also covers a tre­mendous range of applications and nearly all accelerometer product offerings have been used in these important investigations. Flut­ter testing, rocket launch pad dynamics, air­craft EMA, ammunition investigations, heli­copter rotor reactions, etc. are a few of the common measurements performed.
Structural testing
Mechanical devices, assemblies and con­structions of all types are investigated using accelerometers to measure their dynamic re­sponse when subjected to a known input. The deformation pattern, when the speci­men experiences resonance, can be com­puted from the measured data.

pageCatalog pdf di En 2012-05-22-30