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Parametric Curve Tracer Configurations

Parametric Curve Tracer Configurations
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Parametric Curve Tracer Configurations - 1

• Complete solutions engineered for optimum price and performance • Field upgradable and reconfigurable – convert your PCT to a reliability or wafer sort tester • Configurable power levels: –– From 200V to 3kV –– From 1A to 100A • Wide dynamic range: –– From µV to kV –– From fA to 100A • Full range of capacitancevoltage (C-V) capability : –– From fF to µF –– Supports 2, 3, and 4 terminal devices –– Up to 3kV DC bias High Power Device Characterization Developing and using MOSFETS, IGBTs, diodes and other high power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. Keithley’s line of high power Parametric Curve Trace configurations supports the full spectrum of device types and test parameters. Keithley’s Parametric Curve Trace configurations include everything necessary for the characterization engineer to develop a complete test system quickly. ACS Basic Edition software provides complete device characterization, including both real-time trace mode for quickly checking fundamental deivce parameters like breakdown voltage and full parametric mode for extracting precise device parameters. ACS Basic Edition goes beyond traditional curve tracer interfaces by offering a broad array of sample libraries. More important, users have complete control of all test resources, allowing the creation of more advanced tests than previously possible on a curve tracer. Electrical characterization of a variety of power device types, including: MOSFET Measurements of key parameters, such as: Breakdown Voltage (Bvdss, Bvceo) On-State Current (Vdson, Vcesat, Vf) Drain/Collector Leakage (Idss, Ir/Icbo,Iceo) Gate/Base Leakage (Igss, Ib) Threshold or Cutoff voltage (Vth, Vf, Vbeon) Forward Transfer (yfs, Gfs, Hfe, gain) Capacitance (Ciss, Coss, Crss) • High performance test fixture supports a range of package types • Probe station interface supports most probe types including HV triax, SHV coax, standard triax, and others APPLICATIONS • Power semiconductor device characterization and testing Parametric curve tracer configurations with Model 8010 Test Fixture Parametric curve tracer configurations Parametric Curve Tracer Configurations • Characterization of GaN and SiC, LDMOS and other devices • Reliability studies on power devices • Incoming inspection and device qualification 1.888.KEITHLEY (U.S. only) www.keithley.com A Greater Measure of Confidence

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Parametric Curve Tracer Configurations - 2

Parametric Curve Tracer Configurations Ordering Information WAFER LEVEL CHARACTERIZATION 8020 High Power Interface Panel Parametric curve tracer configurations 2600-PCT-1B Low Power 2600-PCT-2B High Current 2600-PCT-3B High Voltage 2600-PCT-4B High Voltage and High Current Accessories Supplied ACS Basic Component Test Software KUSB-488B USB to GPIB Adapter All cables and adapters for connecting to the 8010 Test Fixture or 8020 High Power Interface Panel Note: PC and monitor not included; user must supply a Windows XP/7 PC with a USB port. High Power System SourceMeter (adds 50A to any...

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Parametric Curve Tracer Configurations - 3

Parametric Curve Tracer Configurations Typical Power Transistor Parameters Symbol Bvdss, Bvceo Breakdown Voltage Test Method 1 Id–Vd or Id (pulse) Typical Best Resolution On-State Current (Pulse) Drain/Collector Leakage Current Idss, Ir/Icbo, Iceo RDS(on), Vcesat Input Capacitance Output Capacitance Reverse Transfer Capacitance Gate/Base Leakage Current On-State Threshold Voltage or Cutoff Voltage Forward Transfer Admittance or Forward Transconductance On-State Resistance 1. Test method used for extracting the parameter. Only typical MOSFET listed, but similar method for other devices. 2....

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Parametric Curve Tracer Configurations - 4

Parametric Curve Tracer Configurations Parametric curve tracer configurations Semiconductor Parametric Test Software for Component and Discrete Devices ACS Basic Edition software is specifically tuned to take advantage of the high performance capabilities of the Keithley instrumentation and includes several sample libraries for performing common high power device tests. Unlike other systems, the software allows the user almost unlimited flexibility in configuring all of the measurement channels to create tests far beyond what a traditional curve tracer could achieve. SUMMARY OF TYPICAL...

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