4200-SCS
16Pages

Catalog excerpts

MODEL 4200-SCS Semiconductor Characterization System The simple choice for complex characterization tasks

materials and device research • device and process development the most comprehensive solution for semiconductor device characterization For CMOS semiconductor technology and more n High power MOSFET, BJT, and III-V device characterization n Nanotechnology n Advanced n Organic n Solar electronics characterization cell/photovoltaic device characterization

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device modeling • reliability and lifetime testing • failure analysis DC I-V, C-V, pulse, and ultra-fast I-V testing in the same flexible environment Everything you need to fully characterize a device, material, or process Familiar Windows Interface ® Start testing right out of the box— no training needed Fast, single-click test sequencing No complex programming required Configurable, scalable solution Plug in new capabilities as your test needs change Low noise, wide measurement range, high resolution See more, faster Cost-effective hardware and software upgrades available Modular...

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a complete, integrated solution Industry-standard Windows-based GUI minimizes set-up and integration time. Integrated industrial controller and additional RAM ensure high test throughput, plus system robustness, stability, and security. Store test setups and results right on the system with the high capacity fixed disk drive. The integrated CD-RW drive allows high capacity backup and data transfer. Communicate quickly with a wide range of PC accessories with the built-in USB interface. A Characterization Environment that Grows with Your Test Needs n Flexible test environment and modular...

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The Model 4210-CVU is an integrated instrument designed to plug directly into the chassis, so it can be controlled through the system's point-and-click interface, just like an SMU. RS-232 port Additional USB ports Low noise ground unit with remote sense Configurable with from 2 to 9 SMUs and optional sub-femtoamp Remote PreAmps. Adding high power SMUs won’t restrict SMU capacity. Standard 10/100 BASE-T network interface allows easy access to network files and printers. n-MOSFET Drain Current vs. Drain Voltage (1E–6 pulse width) Use the GPIB interface to control external instruments or to...

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With two channels of integrated sourcing and measurement, the Model 4225-PMU Ultra-Fast I-V module can be applied to a wide range of measurements, including device self-heating, NVM pulse sourcing and transient analysis, ultra-fast reliability testing such as NBTI, and more. Each channel combines high speed voltage sourcing with simultaneous current and voltage measurements on pulse widths from 60nsec to DC at a sample rate of up to 200 megasamples/second. When multiple modules are installed, they are internally synchronized to less than 3ns. If your application demands measuring extremely...

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full range of c-v measurement capability The Model 4200-SCS can be configured to support quasistatic, high voltage, and very low frequency C-V measurements. An extensive set of sample programs, test libraries, and built-in parameter extraction examples are included to make C-V measurements as easy to perform as I-V measurements. For characterizing LDMOS structures, low κ interlayer dielectrics, MEMS devices, organic TFT displays, and photodiodes, an optional C-V Power Package allows making C-V measurements with a DC voltage bias of up to ±200V or 400V differential and a current output of up...

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intuitive interface simplifies device and material characterization and analysis Define a test starting from any of more than 450 supplied sample libraries, using the system’s intuitive point-and-click interface. Click the on-screen Run button to start the test and view a real-time plot. Export data in Excel workbook or ASCII formats and plots in .bmp, .jpg, or .tif formats for either online or offline analysis. Built-in Formulator, graphing, and calc sheet functions simplify complex analyses.

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The Project Navigator organizes tests and controls test sequencing. Switching between different test setups and accessing test results is fast and simple. Sequence tests on a single device by clicking on the device in the Navigator, then clicking the Run button, .|ito<»*> Jltoll-W Keithley Interactive Test Environment (KITE) is designed to let while the sequence is still running. Multiple plots can be viewed users understand device behavior quickly. When running a test at the same time to get a complete picture of device performance, sequence, users can view results and plots for completed...

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EXTEND YOUR SYSTEM’S CAPABILITIES Best high speed, low current measurement sensitivity available in an integrated solution n Supports building complex test sequences, including full prober integration n Can handle the large data sets required in device reliability modeling and process monitoring applications Explore nanotechnology applications The sample project and sample tests included in the Model 4200-SCS bring together the capabilities you need to create powerful nanotech R&D software applications. They can help you to focus on your research on carbon nanotubes, nanowires, and more by...

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Non-Volatile Memory (NVM) Test Libraries New NVM test libraries expand the Model 4200-SCS’s capabilities for testing all types of non-volatile memory devices and materials: n Flash n Phase change memory (PRAM and PC-RAM) n Ferro-electric memory (FeRAM) n Resistive memory (RRAM or ReRAM) n Magneto-resistive memory (MRAM) n Other NVM types The NVM test libraries take advantage of the high speed capabilities of the Model 4225-PMU Ultra-Fast I-V Module and the Model 4225-RPM Remote Amplifier/Switch Module. They support precise sourcing of ultra-fast pulses, as well as accurate measurements of...

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MODULAR ARCHITECTURE SIMPLIFIES SYSTEM INTEGRATION AND UPGRADES Integrated switching control A choice of standard switch configurations simplifies finding the best match for the application. Based on Keithley's six-slot Model 707B or single-slot Model 708B switch matrix mainframes, they include all the components, cabling, and instructions needed to assemble the switch matrix and incorporate it into the Model 4200-SCS test environment. Once the switch is installed, users can connect instrument terminals to output pins quickly with a simple "fill-in-the-blank" interface in the Keithley...

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