Product catalog - JENAer Meßtechnik - #5

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ZLM 700 / 800 Leistungsparameter

Performance data Leistungsparameter

/ Performance data Nichtlinearität ± 1,25 nm (Tripelreflektorinterferometer) ± 0,62 nm (Planspiegelinterferometer)
Non linearity ± 1.25 nm (cube corner interferometer) ± 0.62 nm (plane mirror interferometer) Auflösung Streckenmessung 2,5 nm (Tripelreflektor-interferometer) 1,25 nm (Planspiegel-interferometer) 0,62 nm optional
Resolution Distance measurement 2.5 nm (cube corner interferometer), 1.25 nm (plane mirror interferometer), 0.62 nm optionally Genauigkeit Streckenmessung (20°± 0,5°) mit AUK ± 0,9 ppm (20°± 0,5°) in Vakuum ± 0,08 (±0,02) ppm
Accuracy Distance measurement (20°± 0,5°)
with AUK ± 0.9 ppm (20°± 0,5°) in Vakuum ± 0.08 (±0.02) ppm Auflösung Positionsmessung 2,5 nm (Tripelreflektor-interferometer) 1,25 nm (Planspiegel-interferometer) 0,62 nm optional
Resolution Linear measurement 2,5 nm (cube corner interferometer), 1.25 nm (plane mirror interferometer), 0.62 nm optionally Genauigkeit Positionsmessung (20°± 0,5°) mit AUK ± 0,9 µ/m (20°± 0,5°) in Vakuum ± 0,08 (±0,02) µ/m
Accuracy Linear measurement (20°± 0,5°) with AUK ± 0.9 µ/m (20°± 0,5°) in Vakuum ± 0.08 (±0.02µ/m Genauigkeit Geschwindigkeitsmessung ±0,03 % vom Meßwert
Accuracy Velocity Measurement ±0.03 % to measured value Auflösung Winkelmessung 0,62·10
-7 -7 rad
Resolution Angle Measurement 0.62·10 rad Genauigkeit Winkelmessung ±0,2% vom Meßwert ±0,05 rad pro Meter Verschiebeweg
Accuracy Angle Measurement ±0.2% to measured value ±0.05 rad per meter of shifting distance

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pageCatalog pdf di En 2012-02-05-04