UV/VIS spectrometer (190nm-720nm) - 1 Pages

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Catalogue excerpts

J&M Analytik AG Willy-Messerschmitt-Straße 8 73457 Essingen Datasheet spectrometer MMS UV/VIS 1972 Type Module Connector Entrance slit with cross section converter Grating Blaze wavelength PDA Hamamatsu S3904 Pixels Wavelength range Pixel distance Opt. Resolution according to USP Wavelength accuracy Repeat accuracy Wavelength temperature drift Scattered light Dimensions [LxDxH) Baseline drift S/N ratio *1) *2) Unit Value µm MMS-UV/VIS FSMA 905 70 x 2500 L/mm nm 220 256Q Nm nm/pixel nm 256 190 … 720 ~2.2 <7 nm nm nm/° C < 0.5 < 0.1 < 0.005 % mm³ AU/h AU <1 @240nm ~ 67* 58nn * 40 5*10E-04*1) < 3*10E-05*2) Baseline drift will be measured at 254 nm after 10h warm up @ 21° C±2° ambient C temperature according to ASTM E685 Noise will be measured at 254 nm after 10h warm up @ 21° C±2° ambient C temperature according to ASTM E685, without methanol flow with the following settings: • • • • Integration time <100ms Pixel bunching 2 (2x2,2nm ~ 4nm) Integration time x accumulation <2 sec. Detector saturation ~ 80%,

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