UV/VIS CCD spectrometer (190-980nm). - 1 Pages

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Catalogue excerpts

J&M Analytik AG Willy-Messerschmitt-Straße 8 73457 Essingen Datasheet spectrometer MCS CCD UV/NIR 2098 Type Unit Value µm MCS-CCD UV/NIR SMA 905 70 x 1400 Module Connector Entrance slit with cross section converter Grating Blaze wavelength Hamamatsu S7031 Total Pixels Wavelength range Pixel distance Opt. Resolution according to USP Wavelength accuracy Repeat accuracy Wavelength temperature drift Scattered light Dimensions [LxDxH) Baseline drift S/N ratio *1) *2) L/mm nm nm nm/pixel nm 248 250 1006S 1044x64 200…980 ~0.8 <4 nm nm nm/° C < 0.5 < 0.1 < 0.01 % mm³ AU/h AU < 0.1 @ 340nm ~ 177 * 128 * 75 5*10E-04*1) < 4*10E-05*2) Baseline drift will be measured at 254 nm after 10h warm up @ 21° C±2° ambient C temperature according to ASTM E685 Noise will be measured at 254 nm after 10h warm up @ 21° C±2° ambient C temperature according to ASTM E685, without methanol flow with the following settings: • • • • Integration time <100ms Pixel bunching 5 (5x0,8nm = 4nm) Integration time x accumulation <2 sec. Detector saturation ~ 80%,

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