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MicOS Microscope Optical Spectrometer

MicOS Microscope Optical Spectrometer
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MicOS Microscope Optical Spectrometer - 1

ELEMENTAL ANALYSIS FLUORESCENCE GRATINGS & OEM SPECTROMETERS OPTICAL COMPONENTS OPTICAL COMPONENTS Brings microscope functionality to your spectrometer PARTICLE CHARACTERIZATION MicOS Microscope Optical Spectrometer RAMAN SPECTROSCOPIC ELLIPSOMETRY SPR IMAGING Using a standard microscope for luminescence characterization often means inefficient fiber-optic coupling to the spectrometer, and difficult access for many sample configurations, such as side-emitting devices, or upright cryostats. Nor do standard microscopes offer flexibility for coupling multiple lasers for photoluminescence excitation. HORIBA Scientific’s MicOS merges microscopy and spectroscopy, to provide optimal coupling from sample all the way to the detector. Down-looking or side-looking configurations for side-emitting devices or upright cryostats give you flexible sample access. An optional, fully automated stage for mapping and sample-positioning is available. The MicOS offers a flexible platform for the use of multiple lasers for sample excitation. The system includes a vision camera so you always see what you are measuring. The MicOS is the most microspectrometer solution! Spectrometers Spectral range Microscope Magnification Objective Spot size Sample stage *Specifications are subject to change without notice. Depends on choice of objective, filters, and detectors. 2 For 1200 gr/mm grating and open-electrode CCD 3 BIUV, BIVS, and BIDD formats available for specific quantum-efficiency requirements. 4 Needs two detectors to cover entire range. 5 Other options are available upon request. Aggregate of fluorescent Fluorescence map overlay beads at 700 nm, following excitation at 633 nm

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MicOS Microscope Optical Spectrometer - 2

ELEMENTAL ANALYSIS FLUORESCENCE Gratings Grating 1 Grating 2 Grating 3 Detectors Synapse CCD (250–1050 nm) IGA array (800–1600 nm) Syncerity CCD (affordability) Single-channel detector OPTICAL COMPONENTS OPTICAL COMPONENTS PARTICLE CHARACTERIZATION RAMAN SPECTROSCOPIC ELLIPSOMETRY SPR IMAGING Side & down objectives 10× 20× 50× Custom Lasers 532 nm 633 nm 785 nm Custom Optional mapping Mapping stage Focusing stage Mounting platform Microspectroscopy Benefits Optimum coupling from the sample all the way to the detector Down-looking and sidelooking configurations Flexibility to measure...

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