Catalogue Exposed Linear Encoders
www.heidenhain.de
print switch display
Page / 52
HEIDENHAIN - 2686
/ 52
See other catalogues for HEIDENHAIN
Text version of the page

Selection Guide

Cross sectionAccuracy gradesSignal period
1) The LIP exposed linear encoders are characterized by very small measuring steps together with very high accuracy and LIP for very high accuracy 0.128 µm repeatability. As the measuring standard they feature a DIADUR phase grating applied to a graduation carrier of glass ceramic or glass. The Scale of glass ceramic or glass Interferential scanning principle for small signal periods•• ± 0.5 µm
(higher accuracy grades available on request) ± 1 µm± 0.5 µm 2 µm ± 1 µm4 µm
LIP 4x1R (higher accuracy grades available on request) accuracy and repeatability, and are especially easy to mount.The LIF exposed linear encoders have a measuring standard on a glass substrate manufactured in the DIADUR or SUPRDAUR processes. They feature high LIDA exposed linear encoders are specially designed for high traversing speeds up to 10 m/s, and are particularly easy to mount with various mounting possibilities. Steel scale tapes, glass or glass ceramic are used as carriers for AURODUR or METALLUR graduations, depending on the respective encoder. The LIF for high accuracy with PRECIMET adhesive fi lmInterferential scanning principle for small signal periods Limit switches and homing track••• ± 3 µm4 µm LIDA with thermally adapted graduation carriers Linear coeffi cient of expansion selectable via graduation carrier Limit Switches••± 5 µm 20 µm
(higher accuracy grades available on request) LIDA for high traversing speeds and large measuring lengths Steel scale tape drawn into aluminum extrusion or cemented to mounting surface Limit switches with LIDA 400•• ± 5 µm20 µm ± 15 µm20 µm± 30 µm200 µm± 30 µm200 µm PP two-coordinate encoders feature as measuring standard a planar phase-grating structure manufactured with the DIADUR process on a glass substrate. This makes it possible to measure positions in a plane. LIDA for very limited installation space Small scanning headSimple installation••± 5 µm20 µm PP for two-coordinate measuring Common scanning point for both coordinates Interferential scanning principle for small signal periods•• ± 2 µm4 µm
1) Signal period of the sinusoidal signals. It is defi nitive for deviations within one signal period (see Measuring Accuracy ).

4

DirectIndustry's Virtual Technical Library: PDF Catalogue | Technical Documentation | Brochure | Manual | Industrial directory | Specifications | Characteristics
Search Go
Contents table
page 1 p.1
page 2 p.2
page 3 p.3
page 4 p.4
page 5 p.5
page 6 p.6
page 7 p.7
page 8 p.8
page 9 p.9
page 10 p.10
page 11 p.11
page 12 p.12
page 13 p.13
page 14 p.14
page 15 p.15
page 16 p.16
page 17 p.17
page 18 p.18
page 19 p.19
page 20 p.20
page 21 p.21
page 22 p.22
page 23 p.23
page 24 p.24
page 25 p.25
page 26 p.26
page 27 p.27
page 28 p.28
page 29 p.29
page 30 p.30
page 31 p.31
page 32 p.32
page 33 p.33
page 34 p.34
page 35 p.35
page 36 p.36
page 37 p.37
page 38 p.38
page 39 p.39
page 40 p.40
page 41 p.41
page 42 p.42
page 43 p.43
page 44 p.44
page 45 p.45
page 46 p.46
page 47 p.47
page 48 p.48
page 49 p.49
page 50 p.50
Pages:
1-50
51-52