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| | | FPD Measurement | | |
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| | | OQuantum Yields Measurement System C9920-02 | | |
| | | These systems are for spectrum evaluating and failure analysis the FPD (LCD, plasma, organic LED materials, etc.). | | |
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| | | ■ Quantum Yields Measurement System C9920-01, -02 | | |
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| | | The C9920-01 and -02 measures the absolute quantum yield for light emissions using a photoluminescence method (PL method in the following). The device is made up of an excitation light source that uses a xenon light source and a band-pass filter(monochromater), a nitrogen gas-flow capable integrating sphere and a PMA multichannel detector capable of simultaneously measuring multiple wavelengths that have been corrected for wavelength sensitivity. | | |
| | | •Measurement results of fluorescent quantum yield in AlQ3 thin-film and the Ir(ppy)3:CBP thin film phospholuminescent material (C9920-01/-02) | | |
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| | | ■ External Quantum Efficiency Measurement System C9920-12 | | |
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| | | The C9920-12 is a device for measuring the external quantum efficiency of a sample by exciting the LED device with current (voltage) and measuring the number of emitted photons. Measurements of emissions versus the current applied can be made, inclusive of elements related to the efficiency, such as absorption by the organic LED material layer and glass substrate, and reflective mirror efficiency. | | |
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| | | ■ Brightness Light Distribution Characteristics Measurement System C9920-11 | | |
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| | | ▲Measurement results of fluorescent quantum yield in AQ3 thin-film (green line) and the Ir(ppy)3:CBP thin film phospholuminescent material (yellow line)Quantum yield measurement: 0.20 and 0.86 were obtained for the quantum yields for the AQ3 thin film anc the Ir(ppy)3:CBP thin film phospholuminescent material, respectively. The reason the excitation light intensity of each sample is reduced in comparison with the reference (blue line) is that the excitation light is absorbed by each of the samples. Chromaticity coordinates: (0.346, 0.535) and (0.318, 0.616) were derived from the chromaticity coordinates for Alq3 and Ir(ppy)3:CBP, respectively. | | |
| | | The C9920-11 is a system that measures the brightness, spectrum and the emission angle distribution for a light emitting device by electro-luminescence (EL) method. The light emitting device is set in the sample holder and made to emit light by voltage/current supplied by a power source meter. The light emitted from the device is measured with a detector after passing through a dedicated condensing lens and a fiber. Since the detector employs a spectrometer manufacturer and multichannel back side incidence, cooled CCD, the spectrum can be measured instantaneously with high precision. | | |
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| | | OExternal Quantum Efficiency Measurement System C9920-12 | | |
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| | | ■ FPD Brightness Uniformity Measurement System C10020 | | |
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| | | The C10020 is a system for evaluating the brightness uniformity of flat panel displays, such as liquid industrial crystal panels and organic electro-luminescence panels. It consists of a high precision digital Ccd camera, special optics (micro optics and macro optics) and software dedicated for brightness uniformity measurement. | | |
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| | | ■ Picosecond Fluorescence Lifetime Measurement System C4780 | | |
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| | | OBrightness Light Distribution Characteristics Measurement System C9920-11 | | |
| | | Picosecond to millisecond fluorescence and phosphorescence lifetime are measured with a high dynamic range by combining a laser and a streak industrial camera. The results of the measurements are observed as a two dimensional image made up of a wavelength axis and time axis, so it is possible to visually grasp the lifetimes for each of the fluorescent and phosphorescent components. | | |
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| | | ' ■ Time-Resolved Absorption Spectrum Analyzing System / Flash Photorisis System | | |
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| | | The sample is irradiated with a laser, and the absorption of transient species is measured by monitoring the transient species produced using a high-output xenon lamp or other lamp. By using a streak camera or a gated multichannel detector as the detector, time measurements in the picosecond to millisecond range are possible. This is useful for measurement of intersystem crossing and elucidation of triplet status that are important for phosphorescence materials and the elucidation of the light emission processes and deterioration processes for organic LED materials. | | |
| | | •The absolute quantum yield measurement examples (C10020) | | |
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| | | ' ■ Organic LED Defect Repair System | | |
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| | | This is a system to detect defective pixels of organic LED panels (emission of failure location) and repair using laser technique. | | |
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| | | ▲Example of Brightness Uniformity Meas- ▲Example of Brightness Uniformity Measurement for maximum field of organic LED urement for an organic LED | | |
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