PHOTODETECTORS PHOTODETECTORS ION / ELECTRON DETECTOR MCP ASSEMBLY F9892-12

High Time Resolution & Fast Time Response TOF-MS Detector Less Ringing: 3 % & High Voltage Floating Operation Less Ringing: 3 % & High Voltage Floating Operation Less Ringing: 3 % & High Voltage Floating Operation

The F9892-12 is an ideal detector with a large effective area of 40 mm diameter, and is designed to per-mit floating operation at the input surface voltage of ± 10 kV. The output waveform has almost no ringing.

TMCPB0087EATMCPB0088EB

FWHM1.2 nsFWHM1.2 ns Floating Voltage Floating Voltage ± ± 10 kV 10 kV

Effective area: 40 mmMCP channel diameter: 6 × 10 µ mNumber of MCP stages: 2 Gain: 1
MCP-INPUT SIDEFLOATING VOLTAGE 0 kV -10 kV +10 kV 6 OUTPUT VOLTAGE (mV) OUTPUT VOLTAGE (mV) -60-50-40-30 -20 -10010 RISE TIME: 590 psFALL TIME: 940 ps -70 -120-100-80-60-40-20020 RESPONSE TIME (5 ns/div.) RESPONSE TIME (1 ns/div.)

Small Time Jitter from Flat MCP Small Time Jitter from Flat MCP Small Time Jitter from Flat MCP

There are two major factors creating time jitter. One factor is a warp of MCP which has larger effect on the time jitter. The other is a combination of the channel diameter and bias angle.

AB

Ion transit time differencedue to warp of MCP Ion transit time difference due to input position in channel

A combination of the channel diameter and bias angle

6 µ m12 6 µ m8 12 µ m12 12 µ m8 ION ION ° IONIONIONION ° ° °

Flatness

∆ T 1 ∆ T 2 ∆ T 2 ∆ T 2

± ± 10 10 µ µ m mFlatness

∆ T 2

TIME JITTER COMPARISON

µ m) FactorJitterSum (ns)Warp ( Channel Dia. ( µ m)Bias angle ( 6126200.52004.61282.0 ° ) 120.7 81.0 121.3 82.0 120.7 81.0 121.3
Effective area: 40 mmMCP channel diameter: 6 µ mThickness: 0.3 mm ∆ T
1 (ns) ∆ T
2 (ns)ABAB 0.84 1.12 1.39 2.06 4.65 4.71 4.78 5.02 * Ion mass: 1000 u., Ion acceleration voltage: 10 kV, calculation data

FAST DECAY PHOSPHOR J9758

For Electron Beam Detection â–  Phosphor Decay Characteristics

J9758
TPMOB0184EA

â–  FEATURES

â—� Short decay time â—� Long life â—� High luminescence efficiency

Decay Time Decay Time 2.3 ns 2.3 ns

9 mm

â–  APPLICATIONS

J9758

â—� Semiconductor inspection instrument

RELATIVE OUTPUT (%)

â—� SEM (Scanning Electron microscope) â—� Mass spectrometry

-21 10 100 02 468 Application Product ELECTRON DETECTION UNIT H8770

â—� General electron detection

TIME (ns)

13