Photovoltaic thin film characterization with FISCHER X-Ray spectrometers - FISCHER - #1

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Helmut Fischer GmbH Institut für Elektronik und Messtechnik, 71069 Sindelfingen, Germany, www.helmut-fischer.com Coating Thickness Material Analysis Microhardness Material Testing The FISCHERSCOPE® X-RAY XDV®-SD and X-RAY Conti 5000 For pv cells production the key to success is the perfect characterization of coatings. If it is CIGS, CdTe, CIS or CISSe, ITO or TCO – FISCHERSCOPE X-Ray spectrometers are prepared to do the job. Innovative products for the pv industry from the x-ray experts for coating and material analyzis. The FISCHERSCOPE X-RAY XDV-SD bench-top analyzer is best suited for the requirements of research, process qualification and quality control. For industrial production needs our Conti 5000 in-line x-ray spectrometers are the right solution. These instruments, with outstanding long-term stability, are precise, robust and designed for continuous operation in a production environment. They analyze thin film coatings and layer systems for composition and thickness on various substrates with surface temperatures of up to 500°C (937°F) under ambient air or in vacuum. PV thin film characterization? FISCHERSCOPE® X-Ray spectrometers.