FISCHERSCOPE X-RAY - FISCHER - #29

/ 36


catalogue search
P. 01
P. 02
P. 03
P. 04
P. 05
P. 06
P. 07
P. 08
P. 09
P. 10
P. 11
P. 12
P. 13
P. 14
P. 15
P. 16
P. 17
P. 18
P. 19
P. 20
P. 21
P. 22
P. 23
P. 24
P. 25
P. 26
P. 27
P. 28
P. 29
P. 30
P. 31
P. 32
P. 33
P. 34
P. 35
P. 36
Pages:


See other catalogues for FISCHER

Text version of the page
The FISCHERSCOPE X-RAY XUV is universally suitable for both coating thickness measurements and materials analysis. Typical areas of application are the analysis of functional coatings in the electronics and semiconductor industries such as the thinnest gold/palladium/nickel coatings. In the photovoltaic industry, photo-active coating systems such as CiGS or CdTe can be analyzed together with their base coat and top coat on various carrier materials. Another important application is the analysis of gemstones in order to determine origin and genuineness. The XUV is also well suited for general analyses due to its universal approach. With its large and wide-opening measurement chamber and the big travel range of the programmable XYZ-stage, this spectrometer is well suited for measurements on flat, plane parts as well as for specimens 29 COATING THICKNESS MATERIAL ANALYSIS with complex shapes. Serial tests or array measurements can be obtained with it, in a simple fashion, as well. The precise definition of the measurement location is facilitated by a high-resolution color video camera with high magnification. A laser pointer acting as a positioning aid additionally supports the quick orientation of the samples to be measured. Due to the universal design and the expanded measurement capabilities through the vacuum chamber, the FISCHERSCOPE X-RAY XUV spectrometer is the ideal instrument for research and development but in addition to process qualifying and laboratory applications. Features .. Coating thickness measurement and analysis even for light elements .. Measurements in air, vacuum or under helium .. High resolution and detection sensitivity .. Silicon drift detector .. Determination of complex multi-coating systems .. Operator support through video image and laser pointer .. Automated measurements, array measurements Typical fields of application .. Analysis of thin coatings, traces and light elements .. General material analysis and forensics .. Non-destructive gemstone analysis .. Analysis of Au/Pd/Ni/Cu coatings .. Electronics and semiconductor industries .. Photovoltaic industry .. Research and development, process qualification

pageCatalog pdf di En 2012-05-20-14