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FISCHERSCOPE® X-RAY XUL® and XULM®
The models of the XUL series are compact X-ray fluorescence
spectrometers for coating thickness measurements
and material analyses. X-ray source and detector are
located underneath the measurement chamber. This
allows for simple and precise positioning of the specimens
to be measured.
The XUL instruments are suited for measurements of
small parts with different shapes, such as screws, bolts
or nuts, for contacts and other electronic components.
The metal content of electroplating baths can be analyzed
quickly and easily as well.
The XULM with micro focus tube is designed for measurements
on very small parts, plug contacts and wires.
It also includes four motor-adjustable apertures and
three different primary filters for optimum signal to
noise ratio. It is, therefore, particularly well suited for
the jewelry and watch industries but also for manual
measurements on PCBs.
FISCHERSCOPE® X-RAY XDL®
The instruments of the XDL series are used in quality
assurance, incoming inspections and in production
monitoring. They are particularly well suited for measurements
on large specimens with complex shapes due
to the easily accessible measurement chamber.
Typical applications are measurements of electroplating
coatings on mass-produced parts, but also functional
coatings in the electronics and semiconductor industries.
XDL instruments can measure corrosion protection coatings
and decorative multi-coatings such as chrome on
nickel on copper quickly and precisely.
Due to its modular design, the XDL series can be
equipped with various XY stages and a Z-axis. In the
design with a programmable XY stage, the XDL can be
used for automated testing jobs.
COATING THICKNESS
MATERIAL ANALYSIS
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