| Function Charged-particle tracking, beam transport and electron/ion gun design Description Trak 7.0 is the most advanced 2D code available on any computer platform for charged-particle optics and gun design. The program applies high-accuracy finite-element techniques to find individual orbits or to simulate steady-state beams. Features include effects of beam-generated electric and magnetic fields, automatic generation of input distributions, self-consistent space-charge-limited emission, and field emission. Applications include electron and ion industrial guns, electro-optical devices, electron microscopes, vacuum microelectronics and relativistic high-power beams. Features • Easy-to-understand instruction manual with a library of read-to-run examples. • Combine effects of calculated electric and magnetic fields on independent meshes. • Self-consistent space-charge-limited emission from multiple sources. • Precision interpolation to stopping planes for lens characterization. • Interactive orbit and field plotting menu with built-in hardcopy support. • Automatic determination of self-consistent plasma surfaces for ion extraction. • Advanced secondary-emission models and automatic tracking of multi-generational electron histories. • Automatic calculations of emittance and current density. |