Rasterscope UHV STM - DME - Danish Micro Engineering A/S - #1

Text version of the page

Page 1 Rasterscope™ UHV STM System specification DME 2395 2395-data 0301.wpd Subject to change without notice Rasterscope™ UHV STM. Introduction The possibility of investigating surfaces on an atomic scale has been deeply wished for many years, and the first Scanning Tunneling Microscope (STM) was born in 1981, developed by G. Binnig and H. Roher; a development for which they received the Nobel Prize in 1986. The study of atomically plane surfaces on conduct-ing and semi-conducting samples in a controlled environment in Ultra High Vacuum (UHV) provides the possibility of a profound understanding of the physics in the upper surface layers, including the interaction with the surroundings. Since mid 1991, DME has produced Rasterscope™ UHVSTM microscopes as bolt-on equipment for existing vacuum chambers as well as for chambers acquired for this purpose. These microscopes, supplied to Europe, the Far East, and the USA, have given rise to a series of scientific articles on surface physics and thin film constructions (surface engineering). Today, UHV-STM is a standard analysis method for the study of surfaces, and STM images provides a significant supplement to other well-known vacuum analysis techniques. System Description Rasterscope™ UHV-STM Microscope [DME 1749] is developed in a collaboration with leading scientists and comprises a most flexible, uncomplicated, compact, and rigid microscope. It adapts to various experimental set-ups and has a simple damping system. It is extremely insensitive to vibrations, arising from e.g. turbo pumps, buildings, or speech. Fast optimization of tunneling parameters (e.g. bias voltage, current, loop gain, and spectroscopy functions) is achieved simultaneously with the recording of the topographies. Thus, changes resulting from changed tunneling parameters show up immediately in the images, when a function has been activated. The main parts of the system are, - Rasterscope™ UHV-STM Microscope [DME 1749] - Rasterscope™ C-21 Control System [DME 2366] - Windows SPM program [DME 2355] (PC is optional, since this is often already available.) If the above units are connected with a PC, and the Rasterscope™ UHV-STM Microscope is mounted on the vacuum chamber, you have at your disposal a complete, easy to use SPM microscope with the capability to maintain atomic resolution. Typical Application Areas Typical applications of the Rasterscope™ UHV-STM Microscope [DME 2395] are, ! Study of atomic structures on conducting or semi-conducting surfaces, e.g. metal on metal systems or a long series of surface reaction processes, where the surface is reacting with gas atoms. ! Measurement /illustration of dynamics in surface reactions and self-organizing mechanisms in semi-stable thermal equilibria. Key Benefits Rasterscope™ UHV-STM Microscope has the following main advantages, - Extremely high stability, thermally as well as mechanically (vibration wise)