hand-held atomic force microscope (AFM) - DME - Danish Micro Engineering A/S - #1
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™ Scanner DS 45-40 with tools and probes. Introduction. Today Scanning Probe Microscopes (SPMs) are found in many variations; some for the universal needs of the universities and some for the needs rising within the industrial companies and related institutes.Today the optical microscope makes a natural start-ing point for nearly all surface characteri-zationtasks, and DME has developed the DualScope
™ con-cept with base in the optical microscope; this is the reason for the name - optical image and AFM image simultaneously. Main data for the scanner. DualScope
™ scanner DS 45-40 fits on all opticalmicroscopes with infinite corrected optics andstandard 45 mm objective length. The DS 45-40 scanner has an AFM measuring vo- lume of 40×40×2.7 micron with the 2.7 mi-cron in the Z-direction i.e. the center line of the optical microscope. DS 45-40 contains a complete probe scanner, sinceit contains the scanner itself, the optics of a brightfield objective, the coarse approach mechanism, and the probe detector system (AC-mode). The connection from the scanner to the rest of the SPM system consists of a multi-cable made in medicalPVC which can be used in a clean room. Several SPM probes intended for AC-mode are available with different probe data for tip geo-metry, tip length, resonance frequency, material, etc.
™ Microscope M45, and DualScope
™ Probehead AFM DS PA.In some applications, DS 45-40 is used togetherwith equipment where the optical axis is horizontal, e.g. on optical tables.DS 45-40 is a building block with many possibilitiesfor combination with other equipment, covering applications close to those of optical microscopes or where optical microscopes no longer provide the sufficient information.
2392-data 0504.wpd Subject to change without notice
hand-held atomic force microscope (AFM) - 40257 DualScope
™
Scanner DS 45-40
Product specificationDME 2392
Applications for the DS 45-40. The main applications for DS 45-40 are surface characterizations where the magnification ob-tain- able with the optical microscope is in-sufficient , and especial if very small details are to be studied on rather flat surfaces.DS 45-40 can be used in many different con-figu-rations in optical microscopes - both ordinary and inverted - in specially designed stages, in DME’sDualScope DualScope™ Scanner DS 45-40 with tools and probes. Introduction. Today Scanning Probe Microscopes (SPMs) are found in many variations; some for the universal needs of the universities and some for the needs rising within the industrial companies and related institutes.Today the optical microscope makes a natural start-ing point for nearly all surface characteri-zationtasks, and DME has developed the DualScope
™ con-cept with base in the optical microscope; this is the reason for the name - optical image and AFM image simultaneously. Main data for the scanner. DualScope
™ scanner DS 45-40 fits on all opticalmicroscopes with infinite corrected optics andstandard 45 mm objective length. The DS 45-40 scanner has an AFM measuring vo- lume of 40×40×2.7 micron with the 2.7 mi-cron in the Z-direction i.e. the center line of the optical microscope. DS 45-40 contains a complete probe scanner, sinceit contains the scanner itself, the optics of a brightfield objective, the coarse approach mechanism, and the probe detector system (AC-mode). The connection from the scanner to the rest of the SPM system consists of a multi-cable made in medicalPVC which can be used in a clean room. Several SPM probes intended for AC-mode are available with different probe data for tip geo-metry, tip length, resonance frequency, material, etc.
™ Microscope M45, and DualScope
™ Probehead AFM DS PA.In some applications, DS 45-40 is used togetherwith equipment where the optical axis is horizontal, e.g. on optical tables.DS 45-40 is a building block with many possibilitiesfor combination with other equipment, covering applications close to those of optical microscopes or where optical microscopes no longer provide the sufficient information.
2392-data 0504.wpd Subject to change without notice