New C-26 Controller Functions New lithography functions
The new C-26 controller has been widely also benefit from this measurement method. For
improved with respect to its basic functionality example an STM scanner can write information
for SPM measurements. Many of the control very fast onto a surface by varying its bias
functions related to state-of-the-art SPM voltage without disturbing the distance
instrument are included as well as the design is regulation. Also all other constant-distance
open for future expansion of more functions measurement functions benefit from the Dual
Line Mode™, as the precise XYZ position of the
The C-26 controller follow the line in DME's 20 cantilever can be any function of the information
years of SPM instruments, so that users already from the previous scan line.
familiar with DME's controller and SPM software
can use their instrument experience, while at the The new spectroscopy functions have been
same time the C-26 gives access to totally new dramatically improved and are now fully
and applicable functions. The C-26 controller customizable and also benefit from the exact Z
supports a long series of DME SPM
microscopes control resulting from a digital Z control.
from earlier product series. Additionally, the pure analog Z regulation is still
available and is unmatched with its fast scanning
The following new functions, included in the C-26 speed and low noise figure.
controller, can be emphasized:
The C-26 controller contains all necessary
Programmable Z-axis control interfaces for future extensions, and together
where it is possible for the user to program all with the capability of implementing software
data points of the Z axis movement, at all data updates from the customer's side, it is really
points on the lateral scale, in an almost in almost future-proof.
"free format". Thus it is possible for the operator
to implement all forms of spectroscopy functions
and at the same time maintaining the dynamics
of the SPM scan. It will still be possible to have
analog control of the Z axis, as it is in earlier
DME controller layouts.
Feedback regulation
A newly introduced digital mode of the feedback
loop enables precise real time processing of each
point in the scan line. In combination with the
also newly introduced "Dual Line Mode™", the
information details of a previously scanned line
can be combined with a second measurement
performed on the same line again. This opens a
fully new world of possibilities for fast
measurements where the tip-sample distance
can be precisely controlled without the feedback
signal from the SPM sensor.
DME - Danish Micro Engineering A/S
DME - 20 Years at the Forefront of Nano-Tech
DualScopeTM C-26 Controller
Scanning Probe & Optical Microscope
www.dme-spm.com
