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Lock-in amplifier, Atomic force microscope, Microscope, Scanner, Scanning electron microscope
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DME - Danish Micro Engineering A/S
atomic force microscope (AFM) - 40257 DualScope SPM Probe Scanner DS 95-seriesTM High ResolutionState of the Art Large Scan Area Easy to UseHigh PerformanceFlexibleDualScope SPM Scanner DS 95-series TM |
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