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Plan/actual comparison and best-fit adjustment
Fast comparison of measured data with nominal profiles. Thebest-fit function facilitates optimal alignment of the actual data
to the nominal data for the comparison. The asphere analysis
function is also available. Before ( ) and after ( ) the best-fit-adjustment
Print
The print layout can be customized for extensive measurement logs.All profiles and zooms
Result lists, measurement conditions, commentaryAdd your company’s logo, workpiece drawings and pictures
Export protocol elements for other software applications
Data processing Surface Profile display R, P, W, WC, Wec and DIN 4776 Filter type Gaussian, (DIN 4777), DIN 4776, 2 RC phase-corrected, 2 CR Measuring range/resolution horizontal0.04 µm or 32,000 points vertical0.02 µm–6.4 µm/0.0001 Critical wavelengths roughness 0.08–25 mm as well as variable Critical wavelengths waviness 0.008–25 mm as well as variable Tilt correction methods Compensating line (first half, beginning/end), compensating curve, spline. Without correction Roughness parameters ISO 4287 (97) Ra, Rq, RzDIN, Rp, Rpm, Rv, RC, R3z, RzISO, RT, RmaxDIN, PC, S, Sm, RDa, RDq, Rla, Rlq, Ir, Rsk, Rku, tp, tp2, Rmr, Rdc, Rk, Rpk, Rvk, Mr1, Mr2, Vo, K and in compliance with CNOMO, DIN, ASME, JIS Waviness parameters Wt, Wa, Wem, Wea, Wsm,... Mean values from up to 512 bits of data possible Tolerance comparison possible Profile analysis Actual profile, Abbott curve, amplitude density, Fourier analysis, Dominant Waviness Learn/repeat function possible Data processing Contour Units µm, µinch (selectable) Magnification 0.01–10,000,000 manual and automatic Calculating functions Point, straight line, circle, angle, min./max. function, distance between coordinates, polar coordinates, point of intersection, symmetry Output functions Calculating between profiles, set origin and X axis, rotation and translation of the coordinate system, etc. Additional functions Cartesian grid/polar coordinate display, angle-radius coordinate display, multiple overlay of profiles, combination/selection of profiles, tolerance comparison with nominal values, learn/repeat function
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