Reflective Coatings - Berliner Glas KGaA Herbert Kubatz GmbH & Co. - #1

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Berliner Glas KGaA Herbert Kubatz GmbH & Co • Waldkraiburger Str. 5 • D-12347 Berlin photonics@berlinerglas.de • Phone: +49 30 60905-0 • Fax: +49 30 60905-100 www.berlinerglas.com Reflective coatings e0407 c Reflective Coatings Product BERLINER GLAS manufactures high quality front and rear surface mirrors used in optical instrument applications. Substrates Clear float glass, quartz, glass ceramics and borosilicate glass can be used as substrates. Specifications Aluminium mirrors with protective coatings
Reflectivity: R max. 90 % R max. 94 % R max. 97 % measured at 550 nm
Adhesion and humidity resistance: according to MIL-M-13508 C
Abrasion resistance: according to MIL-M-13508 C UV-applications
Aluminium with MgF2-protective coating for UV-applications up to 187 nm
Aluminium with Si02-protective coating for UV-applications up to 200 nm IR-mirrors
Gold mirrors for infrared applications over 600 nm Highly reflective rear surface mirrors
Silver mirrors
Di-electric mirrors
High efficiency mirrors for single wave length or broadband applications
Laser mirrors with high destruction threshold Other coatings on request: e. g. chromium coating (including with reduced reflectivity), beam splitters, edge filters and cold light mirrors. Software for thin film design is available. Quality Assurance We perform permanent process and manufacturing control with sophisticated measuring instruments. Notes The different alternatives for substrate profiling are described in the product data sheet „CNC- Manufactured Glass Components“. In addition we develop individual solutions. Our computer software for thin films will help you to optimize your films. Measuring Instruments for Quality Assurance Wavefront: Interferometer 4-24”, Shack-Hartmann-Wavefront-Sensor (UV and DUV) Resolution: Computer-supported MTF measurement Centering: Objective metrology station, Laser centering station Angle Precision: Goniometer, interferometer Transmission/ Reflection: Spectrometer, diode array Surface defects: Automatic microscope Micro-Roughness: White light interferometer, AFM Dimension: 3D Coordinate-measurement, caliper, CCD-Micrometer, Stitching interferometer