Plano Optics - Berliner Glas KGaA Herbert Kubatz GmbH & Co. - #1

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Berliner Glas KGaA Herbert Kubatz GmbH & Co • Waldkraiburger Str. 5 • D-12347 Berlin photonics@berlinerglas.de • Phone: +49 30 60905-0 • Fax: +49 30 60905-100 www.berlinerglas.com microstructuring e0407 c Plano and Parallel Plates Product BERLINER GLAS manufactures optics for metrology instrumentation, bio-medical engineering, and research applications, including:
Plano plates
Plano-parallel plates
Wedge-shaped plates with customized shapes and angles
Elliptical plano and parallel plates
Laser substrates as windows and mirrors
Neutral filters according to optical density
Filter glasses of any shape
Linear deviation filters Material Optical glass, CaF2, MgF2, synthetic quartz, glass ceramics, borosilicate glass, filter glass and others are used as substrate materials. Specifications
Dimensions: Up to max. 600 mm Ø in different shapes
Flatness: Up to Lambda/40 PV measured at 632.8 nm depending on the critical area in reflection, wavefront and material.
Evaluation: According to ISO 10110, Part 5 or DIN 3140, Part 5
Parallelism: Up to one angular second (1”)
Micro-roughness: Ra up to 0.3 nm depending on the material
Surface defects: ISO 10110, Part 7 or DIN 3140, Part 7 up to 5/1 x 0.001 depending on the critical area
Optical density: Progressively from 0.1 to 5.0 Quality Assurance In addition to a permanent process inspection we also have a precise final inspection for which we employ sophisticated measurement devices. Notes We manufacture monolithical optics (integration of more than one optical function in one glass component) as well as multifunctional optics (integration of mechanical functions in a glass component). Measuring Instruments for Quality Assurance Wavefront: Interferometer 4-24”, Shack-Hartmann-Wavefront-Sensor (UV and DUV) Resolution: Computer-supported MTF measurement Centering: Objective metrology station, Laser centering station Angle Precision: Goniometer, interferometer Transmission/ Reflection: Spectrometer, diode array Surface defects: Automatic microscope Micro-Roughness: White light interferometer, AFM Dimension: 3D Coordinate-measurement, caliper, CCD-Micrometer, Stitching interferometer