Microstructuring and thin film coating - Berliner Glas KGaA Herbert Kubatz GmbH & Co. - #1

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Berliner Glas KGaA Herbert Kubatz GmbH & Co • Waldkraiburger Str. 5 • D-12347 Berlin photonics@berlinerglas.de • Phone: +49 30 60905-0 • Fax: +49 30 60905-100 www.berlinerglas.com microstructuring e0407 c Microstructuring and Thinfilm Coating Product Complete solutions integrating microstructured patterns and coatings for:
Reticles, masks, diaphragms
Encoded and graduated circles
Gradient filters (continuous or customer-specific behaviour curve
Coated patterns (mosaic filters, customer specific patterns
Anti-reflection coatings (see data sheet “anti-reflective coatings”)
Filters and mirrors (long pass , short pass, narrowbandpass, heat protection filters, cold mirrors, metallic or dielectric mirrors, laser mirrors
Beamsplitting coatings Substrates Clear float glass, grey glass, quartz, and filter glass can be used as substrates. Specification
Spectral ranges: DUV, UV, VIS, NIR
Reticles masks and diaphragms: Diameters from 2 mm to 140 mm Line width >= 1 ìm Line precision up to 0,5 ìm Black, etched or luminescent Quality Assurance Permanent process and manufacturing control guarantees the above specifications. We use sophisticated measurement devices and computer programs. Notes The different possibilities for substrate shaping are described in the product data sheet „CNC-Manufactured Glass Components“. The listed coatings are just a selection of our coating possibilities. In addition, we can develop individual solutions. Our computer software for thin films will help you to optimize your films. Measuring Instruments for Quality Assurance Wavefront: Interferometer 4-24”, Shack-Hartmann-Wavefront-Sensor (UV and DUV) Resolution: Computer-supported MTF measurement Centering: Objective metrology station, Laser centering station Angle Precision: Goniometer, interferometer Transmission/ Reflection: Spectrometer, diode array Surface defects: Automatic microscope Micro-Roughness: White light interferometer, AFM Dimension: 3D Coordinate-measurement, caliper, CCD-Micrometer, Stitching interferometer