C0G (NP0) Dielectric

Specifications and Test Methods

Parameter/TestNP0 Specification LimitsMeasuring Conditions Operating Temperature Range -55ºC to +125ºCTemperature Cycle Chamber Capacitance Within specified toleranceFreq.: 1.0 MHz ±10% for cap 1000 pF Q <30 pF: Q 400+20 x Cap Value1.0 kHz ±10% for cap > 1000 pF 30 pF: Q 1000Voltage: 1.0Vrms ±.2V Insulation Resistance 100,000M or 1000M - µF,Charge device with rated voltage for whichever is less60 ±5 secs @ room temp/humidityCharge device with 300% of rated voltage for Dielectric Strength No breakdown or visual defects1-5 seconds, w/charge and discharge currentlimited to 50 mA (max)Note: Charge device with 150% of rated voltage for 500V devices. AppearanceNo defectsDeflection: 2mmCapacitanceTest Time: 30 seconds Resistance to Variation±5% or ±.5 pF, whichever is greater
1mm/sec90 mm Flexure Stresses QMeets Initial Values (As Above) Insulation Resistance Initial Value x 0.3 Solderability 95% of each terminal should be coveredDip device in eutectic solder at 230 ±5ºC with fresh solderfor 5.0 ±0.5 seconds AppearanceNo defects, <25% leaching of either end terminalCapacitance Variation ±2.5% or ±.25 pF, whichever is greaterDip device in eutectic solder at 260ºC for 60QMeets Initial Values (As Above)seconds. Store at room temperature for 24 ±2 Resistance to Solder Heat InsulationMeets Initial Values (As Above) hours before measuring electrical properties. ResistanceDielectric Meets Initial Values (As Above) Strength AppearanceNo visual defectsStep 1: -55ºC ±2º30 ±3 minutesCapacitance Variation ±2.5% or ±.25 pF, whichever is greaterStep 2: Room Temp 3 minutesQMeets Initial Values (As Above)Step 3: +125ºC ±2º30 ±3 minutes ThermalShock InsulationMeets Initial Values (As Above)Step 4: Room Temp ResistanceDielectric Meets Initial Values (As Above)Repeat for 5 cycles and measure after 3 minutes Strength24 hours at room temperature AppearanceNo visual defectsCapacitance Variation ±3.0% or ±.3 pF, whichever is greaterCharge device with twice rated voltage in Q 30 pF:Q 350test chamber set at 125ºC ±2ºC Load Life (C=Nominal Cap)<10 pF:Q 10 pF, <30 pF:Q 275 +5C/2for 1000 hours (+48, -0). 200 +10CInsulation Resistanceroom temperature for 24 hoursDielectric Meets Initial Values (As Above)before measuring. Initial Value x 0.3 (See Above)Remove from test chamber and stabilize at Strength AppearanceNo visual defectsCapacitance Variation ±5.0% or ±.5 pF, whichever is greaterStore in a test chamber set at 85ºC ±2ºC/ 30 pF:Q 35085% ±5% relative humidity for 1000 hours Load Q 10 pF, <30 pF:Q 275 +5C/2(+48, -0) with rated voltage applied. Humidity <10 pF:Q 200 +10CInsulation Resistanceroom temperature for 24 ±2 hoursDielectric Meets Initial Values (As Above)before measuring.Strength Initial Value x 0.3 (See Above)Remove from chamber and stabilize at

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