Catalogue AVX Film Chip Capacitors
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AECQ Documentation - CB Series
AECQ 200
Test
Page #
Reference
Sample size per lot
Tests Description
Criterion
High Temperature Exposure (Storage)
3
Mil-std-202 method 108
77
1000h at rated operating temperature (125°C) Unpowered Measurement 24h after test conclusion
C = within ± 7% of initial value Delta DF < or = 50.10-4at 1kHz IR = not less than 50% of initial limit
Temperature Cycling
4
JESD22 method JA-104
77
1000 cycles (-55°C to +125°C) 2 cycles per hour - gradient 15°C/mn Measurement after 24h at 100°C
C = within ± 5% of initial value Delta DF < or = 50.10-4at 1kHz IR = not less than 50% of initial limit
Moisture resistance
6
Mil-std-202
method 106
77
t=24 hours/cycle. Note Steps 7A and 7B not required - Unpowered Measurement after 24h at 100°C
C = within ± 8% of initial value Delta DF < or = 70.10-4at 1kHz IR = not less than 50% of initial limit
Biased humidity
7
Mil-std-202
method 103
77
1000 hours 40°C/93%RH Rated Voltage or 48V max Measurement after 24h at 100°C
C = within ± 8% of initial value Delta DF < or = 70.10-4at 1kHz IR = not less than 50% of initial limit
Operational Life
8
Mil-std-202 method 108
77
1000 hours at 125°C
100% of Rated Voltage
Measurement 24h after test conclusion
C = within ± 7% of initial value Delta DF < or = 50.10-4at 1kHz IR = not less than 50% of initial limit
Resistance to solvents
12
Mil-std-202
method 215
5
OKEM clean or equivalent
No visible damage
Mechanical shock
13
Mil-std-202 method 213
30
18 shocks Condition C 1/2 sinusoid 6 msec. 100g's
C = within ± 2% of initial value Delta DF < or = 50.10-4at 1kHz IR = not less than 50% of initial limit
Vibration
14
Mil-std-202 method 204
30
12 cycles each of 3 orientations 5g's for 20 minutes Test from 10-2000 Hz
C = within ± 2% of initial value Delta DF < or = 50.10-4at 1kHz IR = not less than 50% of initial limit
Resistance to soldering heat
15
Mil-std-202 method 210
30
for SMD use Procedure 2 (235°C / 30 sec.) 3 times
C = within ± 5% of initial value Delta DF < or = 50.10-4at 1kHz IR = not less than 50% of initial limit
Thermal Shock
16
Mil-std-202
method 107
30
-55°C/+125°C 300 cycles - transfert 20 sec max Dwell Time =15minutes Measurement 24h after test conclusion
C= within ± 5% of initial value Delta DF < or = 50.10-4 at 1kHz IR = not less than 50% of initial limit
ESD
17
AEC-Q200-002
15
Ongoing
Solderability
18
J-STD-002
replaced by:
JESD22-B102D
15
dipping in solder bath SnPb at 235°C during 3 or 5 sec depending on case size
90% solder coverage minimum
Electrical Characterization
19
User spec.
30
Electrical characteristics measured at : -55°C / +25°C / +125°C
Summary to show Min, Max, Mean and standard deviation at room, Min and Max operating temperatures.
Flammability
20
UL-94
10
20 mm vertical burning test V-0, V-1 or V-2 Electrical Test not required
V-0 or V-1 are acceptable
Board Flex
21
AEC-Q200-005
30
2mm minimum
C = within ± 2% of initial value No visible damage
Terminal Strength
22
AEC-Q200-006
30
a force of 1.8 kg for 60s
No visible damage
8
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