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Catalogue AVX Advanced Products

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SMPS Stacked MLC Capacitors

(SM Style) DSCC #87106 and #88011

Table II. Group A inspection.


Inspection	Requirement paragraph of MIL-PRF-49470	Test method paragraph of MIL-PRF-49470	Sampling procedure
Subaroup 1 Thermal shock and voltage conditioning 1/	3.9	4.8.5	100% Inspection
Subaroup 2 Visual and mechanical examination: Material Physical dimensions Interface requirements (other than physical dimensions) Marking 2/ Workmanship	3.4 3.1 3.5 and 3.5.1 3.28 3.30	4.8.4	13 samples 0 failures

1/ Post checks are required (see paragraph 3.9 of MIL-PRF-49470).

2/ Marking defects are based on visual examination only. Any subsequent electrical defects shall not be used as a basis for determining marking defects.

Table III. Group B inspection. 1/


Inspection	Requirement paraaraph of MIL-PRF-49470	Test method paraaraph of MIL-PRF-49470	Number of sample units to be inspected	Number of defectives permitted 2/
Subaroup 1 3/ Temperature coefficient Resistance to solvents 5/ 6/ Immersion Terminal strength 5/	4/ 3.23 3.18 3.24	4/ 4.8.20 4.8.15 4.8.10	12	1
Subaroup 2 Resistance to soldering heat Moisture resistance	3.20 3.21	4.8.17 4.8.18	12	1	6/ 1
Subaroup 3 Marking legibility (laser marking only)	3.28.1	4.8.4.1	6	1
Subaroup 4 Solderability	3.15	4.8.12		0
Subaroup 5 Life	3.26	4.8.22	5 minimum per case code	0

1/ Unless otherwise specified herein, when necessary, mounting of group B samples shall be at the

discretion of the manufacturer. 2/ A sample unit having one or more defects shall be charged as a single defective. 3/ Order of tests is at discretion of manufacturer. 4/ See 3.2.3 of DSCC 87106.

5/ Sample size shall be 3 pieces with zero defectives permitted.

6/ Total of one defect allowed for combination of subgroup 1, subgroup 2, and subgroup 3 inspections.

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