MFP NanoIndenter - Asylum Research - #1

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Asylum’s MFP NanoIndenter is a true instrumented indenter and is the first AFM-based indenter that does not use cantilevers as part of the indenting mechanism. These characteristics and the use of state-of-the-art AFM sensors provide substantial advantages in accuracy, precision and sensitivity over other nanoindenting systems. Overview and Advantages Unlike cantilever indenters, the MFP NanoIndenter (Figure 1) moves the indenting tip perpendicular to the surface. This vertical motion avoids the lateral movement and errors that are inherent in cantilever-based systems. Compared to conventional commerciallyavailable instrumented nanoindenters, the MFP Nano- Indenter provides lower detection limits and higher resolution measurements of force and indentation depth with the superior precision of AFM sensing technology. The indenter is completely integrated with the AFM, providing the unique ability to quantify contact areas by performing AFM metrology of both the indenting tip and the resulting indentation (Figure 2). These direct measurements enable analysis of material properties with unprecedented accuracy relative to indirect calculation methods. The design uses passive actuation through a monolithic flexure, minimizing drift and other errors in depth measurement. The positioning accuracy in the sample plane is subnanometer using the MFP’s closed loop nanopositioning sensors. The NanoIndenter Head utilizes advanced diffraction-limited optics coupled with CCD image capture for precision navigation of the tip to areas of interest on the sample. The MFP Instrumented NanoIndenter for Quantitative Materials Characterization MFP NanoIndenter DATA S H E E T 1 9 Figure 2: Indenting on dentin (left of crack), and enamel (right) on a human tooth sample. The indentations in each row (one row is circled) were all created with the same maximum force. The smaller indents on the enamel demonstrate that it is harder than the dentin, 70ìm scan. Sample courtesy D. Wagner and S. Cohen, Weizmann Institute of Science. Figure 1: The MFP NanoIndenter intregrates the quantitative capabilities of instrumented nanonindenters with the resolution of AFM/SPM to provide advanced materials characterization with enhanced accuracy, precision and sensitivity.