mPDS 2000V3 Evaluation Unit - Anton Paar - #2

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mPDS 2000V3 Evaluation Unit The Anton Paar mPDS 2000V3 Evaluation Unit is a powerful process computer which measures density and/or sound velocity and temperature, and calculates concentration in combination with a: - DPRn Density Transducer - SPRn Sound Velocity Transducer - DSRn Density/Sound Velocity Transducer - DMA 512P/DMA HPM External Density Cell 4 Handles up to 256 products with individual product names 4 Additional direct connection of Carbo CO2 transducer for CO2 measurement and compensation in beverages 4 Permanently stored standard programs and application programs for customer specifications Technical specifications System inputs Connection of one DPR(n), SPR(n), DSRn transducer, or DMA 512P/DMA HPM external density cell 4 analog inputs 0 to 20 mA active/passive, accuracy 0.1 % of FS 4 digital inputs e.g. filler stop 2 counter inputs e.g. bottle counter External product selector 8 bits, 256 products System outputs 3 analog outputs 4 to 20 mA active, accuracy 0.1 % of FS 6 digital outputs 2 relays for limit monitoring 24 V, 0.7 A Communication interface RS 232 or RS 485, Profibus DP (optional) Graphic display 256 x 64 pixel Power supply 85 to 260 VAC, 48 to 62 Hz Power consumption 30 VA Dimensions (W x H x D) 208 x 160 x 300 mm (8.2 x 6.3 x 11.81 inches) Panel cutout 186 x 138 mm (7.33 x 5.44 inches) Degree of protection Front IP55 Weight Approx. 5 kg (11 lb) 4 Parameters for - temperature compensation - concentration determination - limit monitoring - scaling of AI and AO - product adjustment 4 Data acquisition with Windows-based DAVIS software (optional) Specifications subject to change without notice. 01/09 A90IP01-C Your distributor: Anton Paar® GmbH A-8054 Graz, Anton-Paar-Str. 20 Tel.: +43 (0)316 257-0, E-mail: info@anton-paar.com Fax: +43 (0)316 257-257, Web:www.anton-paar.com Instruments for: Density & concentration measurement Rheometry and viscometry Sample preparation Microwave synthesis Colloid science High-precision temperature measurement Refractometry Polarimetry X-ray structure analysis