Electronic Measuring Instruments Catalog 2007 - Anritsu - (Version JPG) - Page n° 75 - PDF Catalogue | Technical Documentation

See other catalogues for Anritsu

Power meter, Laser diode, X-ray inspection, Fiber optic test, Signal analyzer

Text version of the page

OPTICAL MEASURING INSTRUMENTS

/inritsu

Clock Recovery (Option 2)

Bit Master extracts a clock from the high speed signal for more convenient measurements than using external references. The supported data rates and sensitivity are shown in the following table.


	Description	Specification
	Data Rates	9.8-12.5 Gbps 0.1-2.7 Gbps
	Sensitivity	50 mV p-p maximum

For mask compliance testing of optical interfaces on SFP/XFP modules, the Bit Master can transform one of the two electrical channels to an optical interface with an external optical to electrical (O/E) module. The external O/E module, part number OEC10G-1A, serves two main functions. First, the external O/E module converts the optical wavelength output between 750 and 1650 nm of the SFP/XFP module to electrical signals for measurement. Second, this module contains the necessary 4th order Bessel-Thomson filter (BTF) response required by the testing standards for 10G Ethernet. This option enables the software for optical measurements. The optical module must be ordered separately.

Performance Specifications


Standard Measurement Capabilities	Displays	Eye pattern display Pulse pattern display
Standard Measurement Capabilities	Measurements	Statistical (NRZ), histograms, mask compliance (OC192, 10GE, 10GE-LX4, plus user defined masks)
	Clock Trigger Frequency	0.1-12.5 GHz
	Clock Trigger Sensitivity	80 mVp-p, typical (>1 GHz) 200 mVp-p, typical (<1 GHz) 2 Vp-p, max input before damage
Horizontal System	RMS Jitter, RMS	5-12.5 GHz: 1 ps, typical; 1.5 ps, maximum 1-5 GHz: 1 ps, typical 0.1-1 GHz: 2 ps, typical
	Eye Mode Scale Factor	1UI minimum full scale
	Pattern Mode Scale Factor	1 bits minimum full scale
	Input Range	±500 mV offset, minimum ±400 mV dynamic range, minimum ±2 V, maximum input before damage
Vertical System	Amplitude Accuracy (after internal Cal)	See Figure 1 for maximum amplitude accuracy values
Vertical System	Bandwidth (-3dB)	DC-20 GHz, minimum DC-25 GHz, typical Flatness: ±1dB, typical
	Noise, RMS	0.5 mV, typ , 1.0 mV, maximum
Digital System	Sampling Speed	100 ksamples/sec, typical

Figure 1: Amplitude accuracy for different scale values plotted against the values of reading minus offset. For example, for a 400 mVp-p signal with a 50 mV DC offset, setting the instrument scale to 50 mV/div and the offset to 50mV results in the following readout accuracy values: ±8 mV for the +200 mV peak value and ±11 mV for the -200 mV peak value.

Optical Interface via external O/E Module OEC10G-1A (Option 3)


	Multimode Fiber Input (accepts single mode, too)	62.5 urn with FC
	Wavelength Range	750-1650 nm
	Bandwidth (-3dB electrical)	DC-7.5 GHz typical
	850 nm Responsivity	0.55 A/W, typical
	850 nm Conversion Gain	200 V/W, typical
	1310/1550 nm Responsivity	0.95 A/W, typical
	1310/1550 nm Conversion Gain	350 V/W, typical
	Optical Noise	15 uW, typical
	Optical Sensitivity	-15 dBm, typical -8 dBm, typical for operation with CRU (opt 002)
	Optical Overload	+2 dBm, minimum +5 dBm, maximum input before damage
	Optical Power Measurement Accuracy	1dB, typical (calibrated for 1550 nm wavelength)
	Electrical Return Loss	-10 dB, typical
	Optical Return Loss	-30 dB, typical

Clock Recovery (Option 2)


	Clock Rates	9.8-12.5 GHz
	Clock Rates	0.1-2.7 GHz
	Sensitivity	25 mVp-p, typical, 50 mVp-p, maximum
	Input levels	2 Vp-p, max input before damage
	Jitter, RMS (additive)	9.8-12.5 Gbps: 20 mUl, typical; 40 mUl, maximum 0.1-2.7 Gbps: 2 mUl, typical
	Loop Bandwidth (typical)	9.8-12.5 GHz Band: 1.5 MHz, typical 0.1-2.7 GHz Band: OC-48: 490 kHz, typical OC-12: 71 kHz, typical OC-3: 23 kHz, typical

Continued on next page

http://www.anritsu.com

Electronic Measuring Instruments Catalog 2007 - Anritsu - #75

Power meter, Laser diode, X-ray inspection, Fiber optic test, Signal analyzer