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IP/NETWORK MEASURING INSTRUMENTS

NETWORK PERFORMANCE TESTER

Ethernet

MP1590B

One Box Tester supporting Converged Network

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For detail and specification, refer to the data sheet. The MP1590B Network Performance Tester can be used to makeperformance tests and jitter measurements of previous PDH, DSn, SDH/SONET, and OTN-related equipment and devices as well as OTN, EoS, virtual concatenation, and LCAS measurements of so- called next-generation networks. It uses the Ethernet plug-in mod- ules from the Anritsu MD1230 IP Tester series to provide a single- cabinet measurement solution for IP networks. Furthermore, when used by combining the built-in differential electrical interface and the Jitter Measurement Unit, it offers an accurate jitter measurement so- lution for optical modules, such as XFP. Depending on the plug-in unit combination, the MP1590B offers OTN, SDH/SONET, EoS, jitter, Ethernet, etc., measurements for converged next-generation networks.

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LCAS measurement EoS-supported units support LCAS measurement. Built-in functions such as the Summary function for quickly finding the status of each member on the Sink and Source sides, the LCAS send function that can generate multiple sequence patterns, and the LCAS capture function that can capture up to 64 sequences are all built-in. Using these functions permits verification of complex LCAS functions using simple operations.

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Ethernet/IP measurement The MP1590B also supports use of the 10M/100M, Gigabit and 10 Gigabit Ethernet modules used by the Anritsu MD1230A without modifications, permitting genuine IP measurements such as QoS un- der various conditions, multi stack VLAN, and different send clocks. Since each unit/module can be used independently, multiple layers such as OTN, SDH/SONET, Ethernet, IP and TCP/UDP can be measured.

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EoS function measurement The MU150101A EoS Unit supports GFP-F, LEX, LAPS (X.86), PPP, CiscoHDLC, and MAPOS encapsulation methods. EoS frame load testing, error and alarm detection using more than 120 real-time counters, as well as protocol analysis, such as Ethernet and EoS us- ing the capture and analysis function, are all supported. A single MP1590B supports PDH (2.048, 8.448, 34.368, 139.264 Mbit/s), DSn (1.554, 44.736 Mbit/s), STM-0/1/64, STS-1/3/192 elec- trical interfaces, as well as STM-0/1/4/16/64, STS-1/3/12/48/192, OUT-1, and OUT-2 optical interfaces. Supports PDH/DSn/SDH/SONET/OTN (1.5 Mbit/sn to 10.7 Gbit/s) interfaces with only one unit Virtual concatenation member size

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Virtual concatenation Both virtual concatenation mapping and arbitrary concatenation mapping are supported. And of course, Differential Delay is supported too; various measure- ments can be made with a delay on the DUT. When using low-order virtual concatenation, VCG members can be cross any AUG.

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Differential electrical interface test solution The jitter of optical transceiver modules, such as XFP modules, can be accurately measured by combining units supporting 9953 Mbit/s, 10.3 Gbit/s and 10.7 Gbit/s differential electrical interfaces with the Jitter Unit. This offers ideal information for clarifying various prob- lems and phenomena as well as an established measurement solu- tion for unmeasurable products with a built-in differential electric in- formation having fine characteristics. In addition to measuring devices and modules, it is also possible to perform jitter measurement (host system evaluation) of electrical dif- ferential interfaces (part connected with optical transceiver modules) for transmission equipment and evaluation board with built-in trans- ceiver modules.
VC-4-Xv (X = 1 to 16)VC-3-Xv (X = 1 to 48)SDHAU4-VC-3-Xv (X = 1 to 48)VC-12-Xv (X = 1 to 63) VC-11-Xv (X = 1 to 64) STS3cSPE-Xv (X = 1 to 16) STS1cSPE-Xv (X = 1 to 48)SONETSTS3cSPE-VC-3-Xv (X = 1 to 48)VT2SPE-Xv (X = 1 to 63)VT1.5-Xv (X = 1 to 64) http://www.anritsu.com 206