PHE102 Spectroscopic Ellipsometer - Angstrom Advanced - #5

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Angstrom Advanced Inc. Example: Multilayer Structure

3 Surface Rough Layer11.6 nm2 BLT Films321.4 nm1 SiO221.5 nm0 Si1 mm

Experimentaldata

>

Fittingdata

ε

BLT(590)BLT(700)+50

020 40 60 80100 120

BLT(700)BLT(590)+50

> 2 ε

020 40 60 80100 0.51.01.52.02.53.03.54.04.55.05.56.0 Photonenergy(eV)

Example:Thick Film StructureExample:Thin Film Structure1 SiO2 10.0 mm1Au 1.0 nm0 Si 1 mm 0 Si 1 mm

Copyright(C) 2006 Angstrom Advanced. All Rights Rserved.

Instruments for Thin Film and Semiconductor Applications: 639 Granite Street, Suite 222, Braintree, MA, 02184

Tel: 781-519-4765 Fax: 781-519-4766


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