iKon-M USB X-Ray Brochure - Andor Technology - #2

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x-ray solutions

Features Benefits Head Office / Europe

•Unparalleled thermoelectric cooling •TE cooling to -90ËšC 7Millennium WaySpringvale Business Park Belfast BT12 7AL Northern IrelandTel:+44 (0)28 9023 7126Fax: +44 (0)28 9031 0792 •Ultra low noise readout •Down to 2.5 electrons rms withintelligent low noise electronics •High QE sensor options •Back-illuminated sensors for maximumphoton capture and high S/N ratio •Software selectable readout speeds (upto 2.5 MHz •Faster readout for focusing andfollowing dynamic events •High quantitative dynamic range •16-bit scientific grade A/D; both strongand very weak signals in a single frame

North America

425 Sullivan Avenue - Suite 3 South Windsor CT 06074 USATel: +1(860) 290-9211Fax: +1(860) 290-9566 •Software selectable pre-amp sensitivity •User configurable system optimization •USB 2.0 PC interface •"Plug and Play" connectivity direct fromcamera to PC •External trigger •TTL input and output for synchronizationto experimental events •Vacuum interface options •Rotatable interface flange with integralfilter holder (DO variant) •User friendly software interfaces foracquisition and analysis

Japan

•Andor’sSolis-i softwareand SDK 7F Ichibancho Central Building22-1 Ichiban-cho Chiyoda-ku Tokyo 102-0082 Japan Tel: +81-3-3511 0659Fax: +81-3-3511 0662

China

Room 1116, Zhejiang Building No. 26, An Zhen Xi Li Section 3, Chaoyang District Beijing 100029 ChinaTel: +86-10-5129-4977Fax: +86-10-6445-5401
Andor,the Andor logo and iKon-M aretrademarks of Andor Technology plc.All other marks are property of their owners.Changes areperiodically made to the product & specifications are subject to change without notice August 08

www. andor .com


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