Catalogue Aeroflex SMART^E Model 5100 TR Module Test Environment
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Synthetic

Model 5100 TR ModuleTestEnvironment

TM 5000 SmartEnvironment5000Series

mart

e

The SMART^E
TM 5100 is a complete test environment for testing TR modules. It provides all of the stimulus andmeas u urement resources required for performing a complete suite of transmit and receive mode tests to ens
The SMART^E ure thatthe amplitude and phase control functions meet their specifications. The environment is par u ticularly adept at highfidelity error-corrected s-parameter measurements at very high throughput ra t tes. t
•Complete Synthetic Test EnvironmentHardware, software, processes,support•Optimized forTRModule Test Test Module Subassemblies,Modules & Multi-module Assemblies on One System•Highest Test Throughput Available •Proven Systems Deployment5th Generation Solution -MajorCustomers Worldwide•Full Range of Required Mixed SignalCapabilitiesDC, Digital, Analog, RF/Microwave•System Level ArchitectureCalibration, Verification, Alignment•Open System ArchitectureSystem Hardware & Software, TPSs TM 5100 TR Module Test Environment is a memberof the SMART^E TM 5000 Series, which is a complete test solutionsenvironment from Aeroflex. The Model 5100 encompasses hard-ware, software, test practices and support along with standard andcustomizable test programs tailored to the specific problems of test- ing high performance modules utilized in a variety of phased arrayradars. Such radars depend upon synchronous phase and amplitudecontrol of literally tens to, possibly, thousands of TR modules in a matrix of such modules in parallel to electronically shape transmitand receive beams to light up, detect and monitor radar targets.The Aeroflex SMART^E TM 5000 Test Environment is based uponthe 5th generation evolution of Aeroflex synthetic test technology.Aeroflex synthetic test systems are successfully deployed in a varietyof high performance test applications including satellite payload test, advanced TR module test and military ATE.A Synthetic Test System is comprised of stimulus and measurementchannels which may be exposed to the test system engineer, pro-grammer and test engineer in the form of a functionally integrated but not necessarily physically integrated (as compared to a classicalinstrument) collection of components. For example, a multi-stageupconverter consisting of a digital baseband signal source or a high quality oscillator (or both on a multiplexed basis) with IF up conver- sion and filtering, with tunable RF up conversion and filtering mayprovide the same functionality as a microwave synthesizer. A func-tionally integrated but not necessarily physically integrated set of modules consisting of an RF/microwave downconverter with signalconditioning, IF downconversion, filtering and digitizing with digitalsignal processing software may serve to provide the measurements of a power counter, network analyzer manufacturer or supplier of spectrum analyzer. The resultof such componentization of in a synthetic system of the stimulus Forthe verylatestspecifications visit
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