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Spectrum Analyzer Plug-in
The spectrum analyzer plug-in enables spectrum and time domain
measurements to be performed within PXI Studio on acquired I & Q
data from 3030 Series RF digitizers.
Figure 6: Spectrum Analyzer plugin screenshot
Spectrum measurements can be made over a maximum span width
of 200 MHz with continuously variable resolution bandwidths from
1 Hz to 10 MHz (limited by span).
The spectrum analyzer supports measurement of occupied bandwidth
and adjacent channel power where up to 99 channels can be
specified each with arbitrary channel spacing and channel bandwidth.
The spectrum analyzer provides display traces of power, frequency
and phase versus time as well as power spectrum.
Optional system specific measurement plug-ins
Each optional measurement plug-in provides a complete set of measurement
functions to characterize the RF parametric performance of
components and devices in accordance with the requirements of the
relevant communications standard.
GSM/EDGE MEASUREMENT SUITE
A complete suite of measurement functions to characterize GSM and
EDGE mobile transceiver RF performance using procedures as
defined in 3GPP 51-010-1 V5.2.1 sections 13.17.1-4 and 13.14.2
• TX average power and burst power profile
• Phase error (peak and RMS)
• 8PSK EVM, origin offset suppression
• 95th percentile EVM
• Frequency error
• Output radio frequency spectrum
• Receiver BER measurement
• Fast Sequence Tuning (FST)
The GSM/EDGE measurement suite supports analysis of all major
GSM/EDGE Tx and Rx characteristics including average RF power,
burst profile, modulation quality (either as phase error or error vector
magnitude), frequency error, spectrum due to modulation and
switching and Rx BER (using loopback methods as defined in ETSI
TS 100 293-GSM 04.14). EDGE signals can be further characterized
in terms of Origin Offset Suppression and 95th Percentile EVM.
Figure 7: GSM/EDGE plug-in screenshot
The PXI Studio plug-in enables analysis of either Normal or Access
burst types with automatic detection of modulation type and training
sequence (TSC). Results are provided as both numerical tabular or
graphical trace displays.
Fast Sequence Tuning (FST)
The fast sequence tuning (FST) feature permits high speed parallel*
alignment of transmitters and receivers using list mode to control
synchronous switching between multiple instruments states.
* Where supported by the device under test.
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