Aeroflex ATE 4250 Series Advanced Manufacturing Test Systems - AEROFLEX - #1

Text version of the page

For the very latest specifications visit www.aeroflex.com The flagship advanced manufacturing test system that offers a wide ranging capability in a compact package ATE 4250 Series Advanced Manufacturing Test Systems • Maximum of 2048 test pins • NEW Non-Multiplexed Test Pin Card • Small Footprint • Single Box Solution • Microsoft Windows operating system • Automatic program generation software • Graphical program debug capability • Auto-debug facility • Inductive and capacitive vectorless test • Capacitor polarity testing • ISP and FLASH programming • Test program migration tools Building on the success of the original 4200 series, the 4250 is the new flagship of the Aeroflex range of automatic test equipment. The smaller "footprint" of the 4250 requires some 33% less floorspace than the 4220 and as the 4250 contains an integrated PC based controller and all UUT power supplies, there is no need for any external computer or power supply cabinets. The operator interface is via an LCD monitor with optional touch screen. Full program and fixture compatibility is maintained with existing 4200 series test systems to ensure an easy transfer of programs. An optional migration package allows the reuse of your existing AgilentTM and GenRadTM test fixtures via a fixture adapter. System Architecture The 4250 series is controlled by an integrated industry standard PC running the Microsoft Windows operating system. The system's graphical user interface has been designed to provide a familiar environment allowing new users to quickly progress along the learning curve. Within the range, there are two models: the 4250 inclined interface (35°) and the 4250 horizontal interface. Both models share a common card cage architecture and can be fitted with a range of cards selected from the list below to provide the most appropriate configuration: • Multiplexed Universal In-Circuit card (FA03) - Provides high performance features such as negative drive voltages for ECL testing. Digital pins are multiplexed by a low ratio of 4:1. • Non-Multiplexed Universal In-Circuit card (FA23) - A new nonmultiplexed card that provides a wide range of features, without placing limitations on test point allocation and fixture wiring. By using this card in preference to the multiplexed card, up to four times as many digital test pins may be used within a single device test, ideal for today's large ASIC's and CPLD's. Can be used in conjunction with the Multiplexed Card. • Analog In-Circuit card (FA13) - This cost-effective card provides analog only test pins suitable for MDA and pre-screening application. Q-test II Vectorless tests may be used in conjunction with this card enabling the correct soldering of digital devices to be verified. • General Purpose Input/Output card - This option allows the user to add extra hardware facilities to the standard system, further extending its capabilities. Also used to control the Q-test II Vectorless test hardware.