Aeroflex ATE 4200 Series Advanced Manufacturing Test Systems - AEROFLEX - #1 |
|
You may also be interested in
Frequency counter, Synthesizer, Chassis, Radio test set, Testing machine
Text version of the page
For the very latest specifications visit www.aeroflex.com
A range of advanced manufacturing test systems offering a wide range of test methods and high
throughput capability.
ATE
4200 Series Advanced Manufacturing Test Systems
• Maximum of 2048 pins
• Windows 95 or NT operating system
• Automatic program generation software
• Graphical program debug capability
• Autodebug facility
• Inductive and capacitive vectorless test
• Capacitor polarity
• ISP and FLASH programming
The 4200 series is the flagship of the Aeroflex
range of automatic test equipment. Designed to
be the fastest manufacturing test system on the
market, it is ideally suited to high volume manufacturing
operations where throughput is of
paramount importance. With an established
customer base, the system tests a wide variety
of printed circuit boards covering applications
such as telecoms, automotive and consumer
electronics, amongst others.
By achieving the highest level of fault coverage,
and testing product in the shortest possible
time, the 4200 series reduces capital investment
by providing a single test station within the
beat rate of the production line. Quite simply, a
single 4200 series tester can perform a task
which would require several competitive systems.
Architecture
The 4200 series is controlled by an industry standard PC running
the Windows operating system. The graphical user interface has
been designed to provide a familiar environment allowing new users
to quickly progress along the learning curve.
Within the range, there are currently two systems, the 4215 and 4220.
The differences lay in the testpoint and power supply capacity:
4215 - Maximum of 1152 universal testpoints & three user power
supplies
4220 - Maximum of 2048 universal testpoints & six user power
supplies
Both systems use a cardcage architecture and can be fitted with a
range of cards selected from the following list to provide the most
appropriate configuration:
Analog In-Circuit card
General Purpose Input/Output card
Universal In-Circuit card
Instrument Access card
Analog Functional Card
Analog and Digital Testing
The key to low test times is the optimization of analog tests, including
contact, shorts and opens. The 4200 series offers a combination
of high speed and exceptional accuracy through innovative pipeline
and parallel processing techniques. A further factor is the utilization
of advanced DSP measurements.
High guarding ratios and multiwire measurements ensure component
isolation and accurate diagnostics during In-Circuit tests. The
ability to change all parameters associated with a measurement is
vital to achieving the highest possible accuracy.
|
|