Aeroflex ATE 4200 Series Advanced Manufacturing Test Systems - AEROFLEX - #1

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For the very latest specifications visit www.aeroflex.com A range of advanced manufacturing test systems offering a wide range of test methods and high throughput capability. ATE 4200 Series Advanced Manufacturing Test Systems • Maximum of 2048 pins • Windows 95 or NT operating system • Automatic program generation software • Graphical program debug capability • Autodebug facility • Inductive and capacitive vectorless test • Capacitor polarity • ISP and FLASH programming The 4200 series is the flagship of the Aeroflex range of automatic test equipment. Designed to be the fastest manufacturing test system on the market, it is ideally suited to high volume manufacturing operations where throughput is of paramount importance. With an established customer base, the system tests a wide variety of printed circuit boards covering applications such as telecoms, automotive and consumer electronics, amongst others. By achieving the highest level of fault coverage, and testing product in the shortest possible time, the 4200 series reduces capital investment by providing a single test station within the beat rate of the production line. Quite simply, a single 4200 series tester can perform a task which would require several competitive systems. Architecture The 4200 series is controlled by an industry standard PC running the Windows operating system. The graphical user interface has been designed to provide a familiar environment allowing new users to quickly progress along the learning curve. Within the range, there are currently two systems, the 4215 and 4220. The differences lay in the testpoint and power supply capacity: 4215 - Maximum of 1152 universal testpoints & three user power supplies 4220 - Maximum of 2048 universal testpoints & six user power supplies Both systems use a cardcage architecture and can be fitted with a range of cards selected from the following list to provide the most appropriate configuration: Analog In-Circuit card General Purpose Input/Output card Universal In-Circuit card Instrument Access card Analog Functional Card Analog and Digital Testing The key to low test times is the optimization of analog tests, including contact, shorts and opens. The 4200 series offers a combination of high speed and exceptional accuracy through innovative pipeline and parallel processing techniques. A further factor is the utilization of advanced DSP measurements. High guarding ratios and multiwire measurements ensure component isolation and accurate diagnostics during In-Circuit tests. The ability to change all parameters associated with a measurement is vital to achieving the highest possible accuracy.