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The following configurations are supported Fast Switching
High speed electronic RF switching is used to ensure reliable and
repeatable performance as well as ensure fast settling times,
especially important in high volume manufacturing applications. The
example figure below shows the level settles within 0.1 dB of final
value in <2 ms.
Typical level settling to within 0.1 dB
Calibration
Frequency response calibration data is stored inside the 3065 to help
minimize test system uncertainties. Calibration is in the form of
frequency response data for each RF signal path. The calibration data
is additionally temperature compensated using on board temperature
sensing. Calibration data values can be queried over the PCI bus for
any given frequency making it possible to simplify system level
calibration right up to the plane of the device under test connection
port.
Applications
The 3065 is designed for use in a variety of RF test applications. A
typical application is to use 3065 with a 3025 RF signal generator and
3035 RF digitizer to test an RF transceiver where the (Ó) port acts as
a single port duplex connection point between the two instruments.
This configuration relies upon good isolation between the A and C
ports which for 3065 is better than 35 dB.
Figure 3 – Transceiver testing
A second RF signal generator connected to port A can be routed to
port D providing a second output channel or internally combined at
the (Ó) port to enable Rx selectivity and blocking tests to be
performed. Equally a second RF digitizer can be connected to port A
and routed to port D to provide a second RF input channel. When
routed to the (Ó) port the second digitizer can be used to perform
simultaneous measurement of the common input. This permits out
of band measurement concurrent with in-band measurements on
transmitters.
