SpeckleCam (ESPI) Data Sheet - 4D Technology - #1

/ 2


catalogue search
SpeckleCam (ESPI) Data Sheet - 4D Technology
P. 01
SpeckleCam (ESPI) Data Sheet - 4D Technology
P. 02
Pages:
SpeckleCam (ESPI) Data Sheet - 4D Technology


See other catalogues for 4D Technology

Text version of the page
Interferometry
The Leader in Dynamic
PhaseCam
ESpl
4D Technology extends the flexibility of dynamic interferometry by introducing a new Electronic Speckle Pattern Interferometry (ESPI) system. Ideally suited for the measurement of diffuse objects, this turn-key instrument includes an optical mainframe, a fast Pentium IV computer system and revolutionary 4SightTM phase analysis software.
Incorporating 4D Technology's instantaneous phase measurement imaging, the PhaseCam ESPI simultaneously acquires four phase shifted interferograms. This unique, patented single camera pixelated sensor developed by 4D Technology eliminates the alignment, calibration, and pixel registration problems of multiple camera implementations, enables high spatial sampling with 1K x 1K or 2K x 2K data arrays, and the implementation in a compact and sturdy mechanical configuration.
30 millionths of a second
phase acquisition is possible with this camera exposure limited technique! Enabling the PhaseCam ESPI to operate as much as 10,000 times faster than a conventional temporal phase shifting interferometers.
A baseline measurement is made of the object and subsequent measurements are compared with the baseline to determine deformation. Measurements can be made synchronously or asynchronously with respect to object motion. For measurement of vibrational deformation, synchronous capture can examine changes over a wide frequency and phase
Vibration insensitive, rapid
data acquisition permits accurate Optical testing and quality control during manufacture on the production floor -without the need for costly vibration isolation hardware. Sensitivity to air turbulence is reduced further Improving accuracy and repeatability of data.
4SightTM software's intuitive interface sets a new bench mark for simplicity, ease of use and graphical display for measurement set-up and data analysis. Measure and analyze, mask data, subtract reference on-the fly! Perform Zernike and Seidel, geometric and diffraction analyses; save, print and export data or cut and paste results with unrivaled flexibility.
User selectable mono-static or
bi-static illumination - detection optical configurations permit greater flexibility In measuring diffuse and specular samples with PhaseCam ESPI! Conventional optics and zoom lenses can be used as receiving optics when the high energy illumination beam is transmitted via a separate path. User adjustable fringe contrast enables the operator to optimize signal-to-noise and ensure the minimum data acquisition time independent of surface reflectance.
■■.I-■;:■=■:■■■ spectrum.

pageCatalog pdf di En 2012-02-07-15