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The Leader in Dynamic Interferometry Interferometry

SpeckleCam (ESPI) Data Sheet - 27716 Specifications

Description: Turn-key vibration insensitive E lectronic S peckle P attern I nterferometry (ESPI) system Function Strain measurement of diffuse objectsOptical Configuration Selectable Mono-static or Bi-Static illumination6x Zoom detection imagingAcquisition Mode Simultaneous Phase Shift of speckle interferogramsLaser Pulsed solid state laser @ 532nm, water cooled275mJ/pulse (min), 10nsec pulse length, >1Hz rep ratePolarization Linear, horizontalPupil focus range TBDDetector Single camera, pixelatedsensor, 1K x 1K pixel data array(2K x 2K optional sensor upgrade)Acquisition rate 30 µsec minimum exposure time,>25 frames/sec display; 4 interferograms/frame>25 frames/sec max data acquisition with post processingCables Power supply, camera and power cablesComputer system Pentium IV -Minimum configuration: 3 GHz, 1 GByteRAM,80 GByteHard Drive, CDRW, 18.1” LCD Monitor, mouse, keyboardOperating System Windows XPSoftware 4Sight
Tm , Version 1.0 or later Instantaneous Phase Shifting data acquisition, Burst acquisitionOn the fly data processing with terms / reference removalReference generation, subtraction, data averaging, maskingFiducialaided data set mapping, 2D and 3D surface mapsZernike, Seidel, slope, PSF, MTFUser Manual, Upgrades Free upgrades during warranty periodPhysical Envelope
*One sigma for rmsof 10 data sets of calibration mirror, each data set being an average of 16 measurements.3280 E Hemisphere Loop, Suite 112US Patents 6,304,330 and 6,552,808Tucson AZ 85706-5024OTHER PATENTS PENDING Tel (520) 294 5600www.4DTechnology.com Info@4DTechnology.com Specifications subject to change without notice.©2003 Copyright 4D Technology Corporation. All rights reserved